Characterization Gallery

Electrical and transport properties

Impedance analyzer (operating frequency range up to 10 MHz) and sample inserts for high temperature (tubular furnace) and low temperature (liquid nitrogen cryostat) measurements.

Ferroelectric tester module including also a high voltage amplifier providing up to 10 kV. Sample holder with heater for temperature-dependent measurements up to around 150 ºC in a silicon oil bath.

LCR “Pulse” operation mode in C-V curves. Two options: Agilent 4294A LCR and BK Precision 894 LCR.

● Sweep frequency: 40Hz – 110MHz.
● Bias voltage -40V to 40V
● Classic impedance measurements: Z v.s. f, C v.s. f
● Dynamic and/or Remanent C-V measurements (-40V, 40V)
● Random pulse trains.
● Sequence of pulses.
● Data files quick viewer option.
● Output data file with whole detailed measurement information.

Polarization-electric field (PE) loops. The system uses the Agilent 33220A waveform generator and Tektronix 2014B oscilloscope. The control and analysis software (PE Loops INMA) only works with these two instruments. The system works in two operation modes: Capacitance and shunt resistance. The first one is well known as Sawyer Tower configuration. I-V and C-V, femto Ampere current measurements together with ferroelectric measurements can be done with a Probe Station at a Faraday Box. The main characteristics for the PE system are resumed in the following:

● PE test up to 100Vpp (With Power amplifier), 50Hz to 3kHz.
● Classical ferroelectric loops: Capacitor or resistor element.
● PUND Test.
● Arbitrary Signals test.
● Multi-domain ferroelectric test.
● Endurance test: Triangular train of pulses (Monopolar or bipolar).
● Square nano pulse width option (Until 50ns).

High-resolution spectroscopy and force measurements

Omicron LT-qPlus -SPM. This instrument combines the techniques of atomic force microscopy (AFM) with that of scanning tunneling microscopy (STM) in Ultra-High-Vacuum (UHV) conditions ranging from 300 K to 5K. It is extremely versatile and stable, allowing high-resolution spectroscopy and force measurements. Using a tuning fork probe (q-plus), ultra-thin organic and inorganic systems can be studied on flat surfaces.

Physical Measurements Lab

Magnetic, electric and thermal characterization of materials, in a wide temperature and magnetic field range.

We have expertise and we hold the scientific direction of this research lab, integrated in the "Servicio General de Apoyo a la Investigación" of the University of Zaragoza. Experimental facilities include three automated measurement systems, MPMS-XL, PPMS 9T and PPMS 14T, which allow the characterization of magnetic, thermal, and electrical properties of materials (maximum volume about 1 cm³). Magnetization and ac magnetic susceptibility, heat capacity down to 0.3 K and up to fields up to 14 T, electric conductivity, ac and dc from 0.3 K to 400 K, as a function of sample orientation are the main possibilities of these facilities.

Advanced Microscopy Lab

We have expertise and access to the Advanced Microscopy Lab with techniques like HRTEM, HRSTEM-HAADF, EDX, EELS ( with TEM microscopes, including two FEI Titan® instruments with sub-angstrom image resolution and atomic spectroscopy resolution) for atomic and nanostructure characterization with aberration corrected probe and aberration corrected objective lens.

Clean room facilities and microfabrication

Clean Room Class 10.000. Lithography facilities (optical lithography and nanolithography with three dual beam FIB instruments: Cryogenic Dual Beam Nova 200, Dual Beam Helios Nanolab 600 and 650). Scanning Electron microscopies (FE-SEM, ambient SEM Environmental Scanning Electron Microscope SEM-Quanta FEG 250, ESEM Field Emission Scanning Electron Microscope CSEM-FEG INSPECT 50).